High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method

This article provides data on the scanning tunnelling microscopy (STM), atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) images of InAs(001) surface. Using the frequency-modulation (FM) method in AFM and KPFM, atomic resolution topography and contact potential difference (CPD)...

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Detalles Bibliográficos
Autores principales: Park, Young Min, Park, Joon Sik, Chung, Choong-Heui, Lee, Sangyeob
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2020
Materias:
Materials Science
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7005429/
https://www.ncbi.nlm.nih.gov/pubmed/32055662
http://dx.doi.org/10.1016/j.dib.2020.105177
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author Park, Young Min
Park, Joon Sik
Chung, Choong-Heui
Lee, Sangyeob
author_facet Park, Young Min
Park, Joon Sik
Chung, Choong-Heui
Lee, Sangyeob
author_sort Park, Young Min
collection PubMed
description This article provides data on the scanning tunnelling microscopy (STM), atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) images of InAs(001) surface. Using the frequency-modulation (FM) method in AFM and KPFM, atomic resolution topography and contact potential difference (CPD) images of InAs(001) surface were obtained. The InAs(001) surface reconstruction images observed by STM and AFM are compared. The effect of AFM tip condition and tip-sample distance to AFM and KPFM imaging is verified by measuring frequency shift vs. tip-sample distance spectroscopy. This data article is related to the article entitled, “Kelvin prove force microscopy and its application” (Melitz et al., 2011) [1].
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spelling pubmed-70054292020-02-13 High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method Park, Young Min Park, Joon Sik Chung, Choong-Heui Lee, Sangyeob Data Brief Materials Science This article provides data on the scanning tunnelling microscopy (STM), atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) images of InAs(001) surface. Using the frequency-modulation (FM) method in AFM and KPFM, atomic resolution topography and contact potential difference (CPD) images of InAs(001) surface were obtained. The InAs(001) surface reconstruction images observed by STM and AFM are compared. The effect of AFM tip condition and tip-sample distance to AFM and KPFM imaging is verified by measuring frequency shift vs. tip-sample distance spectroscopy. This data article is related to the article entitled, “Kelvin prove force microscopy and its application” (Melitz et al., 2011) [1]. Elsevier 2020-01-25 /pmc/articles/PMC7005429/ /pubmed/32055662 http://dx.doi.org/10.1016/j.dib.2020.105177 Text en © 2020 The Authors http://creativecommons.org/licenses/by/4.0/ This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Materials Science
Park, Young Min
Park, Joon Sik
Chung, Choong-Heui
Lee, Sangyeob
High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method
title High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method
title_full High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method
title_fullStr High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method
title_full_unstemmed High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method
title_short High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method
title_sort high resolution atomic force and kelvin probe force microscopy image data of inas(001) surface using frequency modulation method
topic Materials Science
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7005429/
https://www.ncbi.nlm.nih.gov/pubmed/32055662
http://dx.doi.org/10.1016/j.dib.2020.105177
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