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NanoThermoMechanical AND and OR Logic Gates
Today’s electronics cannot perform in harsh environments (e.g., elevated temperatures and ionizing radiation environments) found in many engineering applications. Based on the coupling between near-field thermal radiation and MEMS thermal actuation, we presented the design and modeling of NanoThermo...
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Nature Publishing Group UK
2020
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7016178/ https://www.ncbi.nlm.nih.gov/pubmed/32051452 http://dx.doi.org/10.1038/s41598-020-59181-2 |