Demonstration of electron focusing using electronic lenses in low-dimensional system

We report an all-electric integrable electron focusing lens in n-type GaAs. It is shown that a pronounced focusing peak takes place when the focal point aligns with an on-chip detector. The intensity and full width half maximum (FWHM) of the focusing peak are associated with the collimation of injec...

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Detalles Bibliográficos
Autores principales: Yan, Chengyu, Pepper, Michael, See, Patrick, Farrer, Ian, Ritchie, David, Griffiths, Jonathan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7018971/
https://www.ncbi.nlm.nih.gov/pubmed/32054961
http://dx.doi.org/10.1038/s41598-020-59453-x

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7018971/
https://www.ncbi.nlm.nih.gov/pubmed/32054961
http://dx.doi.org/10.1038/s41598-020-59453-x

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