Demonstration of electron focusing using electronic lenses in low-dimensional system

We report an all-electric integrable electron focusing lens in n-type GaAs. It is shown that a pronounced focusing peak takes place when the focal point aligns with an on-chip detector. The intensity and full width half maximum (FWHM) of the focusing peak are associated with the collimation of injec...

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Autores principales: Yan, Chengyu, Pepper, Michael, See, Patrick, Farrer, Ian, Ritchie, David, Griffiths, Jonathan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7018971/
https://www.ncbi.nlm.nih.gov/pubmed/32054961
http://dx.doi.org/10.1038/s41598-020-59453-x
_version_ 1783497425373102080
author Yan, Chengyu
Pepper, Michael
See, Patrick
Farrer, Ian
Ritchie, David
Griffiths, Jonathan
author_facet Yan, Chengyu
Pepper, Michael
See, Patrick
Farrer, Ian
Ritchie, David
Griffiths, Jonathan
author_sort Yan, Chengyu
collection PubMed
description We report an all-electric integrable electron focusing lens in n-type GaAs. It is shown that a pronounced focusing peak takes place when the focal point aligns with an on-chip detector. The intensity and full width half maximum (FWHM) of the focusing peak are associated with the collimation of injected electrons. To demonstrate the reported focusing lens can be a useful tool, we investigate the characteristic of an asymmetrically gate biased quantum point contact with the assistance of a focusing lens. A correlation between the occurrence of conductance anomaly in low conductance regime and increase in FWHM of focusing peak is observed. The correlation is likely due to the electron-electron interaction. The reported electron focusing lens is essential for a more advanced electron optics device.
format Online
Article
Text
id pubmed-7018971
institution National Center for Biotechnology Information
language English
publishDate 2020
publisher Nature Publishing Group UK
record_format MEDLINE/PubMed
spelling pubmed-70189712020-02-21 Demonstration of electron focusing using electronic lenses in low-dimensional system Yan, Chengyu Pepper, Michael See, Patrick Farrer, Ian Ritchie, David Griffiths, Jonathan Sci Rep Article We report an all-electric integrable electron focusing lens in n-type GaAs. It is shown that a pronounced focusing peak takes place when the focal point aligns with an on-chip detector. The intensity and full width half maximum (FWHM) of the focusing peak are associated with the collimation of injected electrons. To demonstrate the reported focusing lens can be a useful tool, we investigate the characteristic of an asymmetrically gate biased quantum point contact with the assistance of a focusing lens. A correlation between the occurrence of conductance anomaly in low conductance regime and increase in FWHM of focusing peak is observed. The correlation is likely due to the electron-electron interaction. The reported electron focusing lens is essential for a more advanced electron optics device. Nature Publishing Group UK 2020-02-13 /pmc/articles/PMC7018971/ /pubmed/32054961 http://dx.doi.org/10.1038/s41598-020-59453-x Text en © The Author(s) 2020 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Yan, Chengyu
Pepper, Michael
See, Patrick
Farrer, Ian
Ritchie, David
Griffiths, Jonathan
Demonstration of electron focusing using electronic lenses in low-dimensional system
title Demonstration of electron focusing using electronic lenses in low-dimensional system
title_full Demonstration of electron focusing using electronic lenses in low-dimensional system
title_fullStr Demonstration of electron focusing using electronic lenses in low-dimensional system
title_full_unstemmed Demonstration of electron focusing using electronic lenses in low-dimensional system
title_short Demonstration of electron focusing using electronic lenses in low-dimensional system
title_sort demonstration of electron focusing using electronic lenses in low-dimensional system
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7018971/
https://www.ncbi.nlm.nih.gov/pubmed/32054961
http://dx.doi.org/10.1038/s41598-020-59453-x
work_keys_str_mv AT yanchengyu demonstrationofelectronfocusingusingelectroniclensesinlowdimensionalsystem
AT peppermichael demonstrationofelectronfocusingusingelectroniclensesinlowdimensionalsystem
AT seepatrick demonstrationofelectronfocusingusingelectroniclensesinlowdimensionalsystem
AT farrerian demonstrationofelectronfocusingusingelectroniclensesinlowdimensionalsystem
AT ritchiedavid demonstrationofelectronfocusingusingelectroniclensesinlowdimensionalsystem
AT griffithsjonathan demonstrationofelectronfocusingusingelectroniclensesinlowdimensionalsystem

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