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Improved DRUS 4H-SiC MESFET with High Power Added Efficiency

A 4H-SiC metal semiconductor field effect transistor (MESFET) with layered doping and undoped space regions (LDUS-MESFET) is proposed and simulated by ADS and ISE-TCAD software in this paper. The structure (LDUS-MESFET) introduced layered doping under the lower gate of the channel, while optimizing...

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Detalles Bibliográficos
Autores principales: Jia, Hujun, Liang, Yuan, Li, Tao, Tong, Yibo, Zhu, Shunwei, Wang, Xingyu, Zeng, Tonghui, Yang, Yintang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7019380/
https://www.ncbi.nlm.nih.gov/pubmed/31892117
http://dx.doi.org/10.3390/mi11010035
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author Jia, Hujun
Liang, Yuan
Li, Tao
Tong, Yibo
Zhu, Shunwei
Wang, Xingyu
Zeng, Tonghui
Yang, Yintang
author_facet Jia, Hujun
Liang, Yuan
Li, Tao
Tong, Yibo
Zhu, Shunwei
Wang, Xingyu
Zeng, Tonghui
Yang, Yintang
author_sort Jia, Hujun
collection PubMed
description A 4H-SiC metal semiconductor field effect transistor (MESFET) with layered doping and undoped space regions (LDUS-MESFET) is proposed and simulated by ADS and ISE-TCAD software in this paper. The structure (LDUS-MESFET) introduced layered doping under the lower gate of the channel, while optimizing the thickness of the undoped region. Compared with the double-recessed 4H-SiC MESFET with partly undoped space region (DRUS-MESFET), the power added efficiency of the LDUS-MESFET is increased by 85.8%, and the saturation current is increased by 27.4%. Although the breakdown voltage of the device has decreased, the decrease is within an acceptable range. Meanwhile, the LDUS-MESFET has a smaller gate-source capacitance and a large transconductance. Therefore, the LDUS-MESFET can better balance DC and AC characteristics and improve power added efficiency (PAE).
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spelling pubmed-70193802020-03-09 Improved DRUS 4H-SiC MESFET with High Power Added Efficiency Jia, Hujun Liang, Yuan Li, Tao Tong, Yibo Zhu, Shunwei Wang, Xingyu Zeng, Tonghui Yang, Yintang Micromachines (Basel) Article A 4H-SiC metal semiconductor field effect transistor (MESFET) with layered doping and undoped space regions (LDUS-MESFET) is proposed and simulated by ADS and ISE-TCAD software in this paper. The structure (LDUS-MESFET) introduced layered doping under the lower gate of the channel, while optimizing the thickness of the undoped region. Compared with the double-recessed 4H-SiC MESFET with partly undoped space region (DRUS-MESFET), the power added efficiency of the LDUS-MESFET is increased by 85.8%, and the saturation current is increased by 27.4%. Although the breakdown voltage of the device has decreased, the decrease is within an acceptable range. Meanwhile, the LDUS-MESFET has a smaller gate-source capacitance and a large transconductance. Therefore, the LDUS-MESFET can better balance DC and AC characteristics and improve power added efficiency (PAE). MDPI 2019-12-27 /pmc/articles/PMC7019380/ /pubmed/31892117 http://dx.doi.org/10.3390/mi11010035 Text en © 2019 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Jia, Hujun
Liang, Yuan
Li, Tao
Tong, Yibo
Zhu, Shunwei
Wang, Xingyu
Zeng, Tonghui
Yang, Yintang
Improved DRUS 4H-SiC MESFET with High Power Added Efficiency
title Improved DRUS 4H-SiC MESFET with High Power Added Efficiency
title_full Improved DRUS 4H-SiC MESFET with High Power Added Efficiency
title_fullStr Improved DRUS 4H-SiC MESFET with High Power Added Efficiency
title_full_unstemmed Improved DRUS 4H-SiC MESFET with High Power Added Efficiency
title_short Improved DRUS 4H-SiC MESFET with High Power Added Efficiency
title_sort improved drus 4h-sic mesfet with high power added efficiency
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7019380/
https://www.ncbi.nlm.nih.gov/pubmed/31892117
http://dx.doi.org/10.3390/mi11010035
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