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Focused Electron Beam-Based 3D Nanoprinting for Scanning Probe Microscopy: A Review
Scanning probe microscopy (SPM) has become an essential surface characterization technique in research and development. By concept, SPM performance crucially depends on the quality of the nano-probe element, in particular, the apex radius. Now, with the development of advanced SPM modes beyond morph...
Autores principales: | , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7019982/ https://www.ncbi.nlm.nih.gov/pubmed/31906005 http://dx.doi.org/10.3390/mi11010048 |