Convenient Real-Time Monitoring of the Contamination of Surface Ion Trap

Recent studies indicated that contamination by adatoms on the surface ion trap can generate contact potential, leading to fluctuations in patch potential. By investigating contamination induced by surface adatoms during a loading process, a direct physical image of the contamination process and the...

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Detalles Bibliográficos
Autores principales: Zhang, Xinfang, Hou, Yizhu, Chen, Ting, Wu, Wei, Chen, Pingxing
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7022994/
https://www.ncbi.nlm.nih.gov/pubmed/31935803
http://dx.doi.org/10.3390/nano10010109

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7022994/
https://www.ncbi.nlm.nih.gov/pubmed/31935803
http://dx.doi.org/10.3390/nano10010109

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