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Convenient Real-Time Monitoring of the Contamination of Surface Ion Trap
Recent studies indicated that contamination by adatoms on the surface ion trap can generate contact potential, leading to fluctuations in patch potential. By investigating contamination induced by surface adatoms during a loading process, a direct physical image of the contamination process and the...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7022994/ https://www.ncbi.nlm.nih.gov/pubmed/31935803 http://dx.doi.org/10.3390/nano10010109 |