Nanotip Contacts for Electric Transport and Field Emission Characterization of Ultrathin MoS(2) Flakes

We report a facile approach based on piezoelectric-driven nanotips inside a scanning electron microscope to contact and electrically characterize ultrathin MoS(2) (molybdenum disulfide) flakes on a SiO(2)/Si (silicon dioxide/silicon) substrate. We apply such a method to analyze the electric transpor...

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Detalles Bibliográficos
Autores principales: Iemmo, Laura, Urban, Francesca, Giubileo, Filippo, Passacantando, Maurizio, Di Bartolomeo, Antonio
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7023401/
https://www.ncbi.nlm.nih.gov/pubmed/31947985
http://dx.doi.org/10.3390/nano10010106

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7023401/
https://www.ncbi.nlm.nih.gov/pubmed/31947985
http://dx.doi.org/10.3390/nano10010106

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