Cargando…
Nanotip Contacts for Electric Transport and Field Emission Characterization of Ultrathin MoS(2) Flakes
We report a facile approach based on piezoelectric-driven nanotips inside a scanning electron microscope to contact and electrically characterize ultrathin MoS(2) (molybdenum disulfide) flakes on a SiO(2)/Si (silicon dioxide/silicon) substrate. We apply such a method to analyze the electric transpor...
Autores principales: | , , , , |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2020
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7023401/ https://www.ncbi.nlm.nih.gov/pubmed/31947985 http://dx.doi.org/10.3390/nano10010106 |
_version_ | 1783498241122238464 |
---|---|
author | Iemmo, Laura Urban, Francesca Giubileo, Filippo Passacantando, Maurizio Di Bartolomeo, Antonio |
author_facet | Iemmo, Laura Urban, Francesca Giubileo, Filippo Passacantando, Maurizio Di Bartolomeo, Antonio |
author_sort | Iemmo, Laura |
collection | PubMed |
description | We report a facile approach based on piezoelectric-driven nanotips inside a scanning electron microscope to contact and electrically characterize ultrathin MoS(2) (molybdenum disulfide) flakes on a SiO(2)/Si (silicon dioxide/silicon) substrate. We apply such a method to analyze the electric transport and field emission properties of chemical vapor deposition-synthesized monolayer MoS(2), used as the channel of back-gate field effect transistors. We study the effects of the gate-voltage range and sweeping time on the channel current and on its hysteretic behavior. We observe that the conduction of the MoS(2) channel is affected by trap states. Moreover, we report a gate-controlled field emission current from the edge part of the MoS(2) flake, evidencing a field enhancement factor of approximately [Formula: see text] and a turn-on field of approximately [Formula: see text] at a cathode–anode separation distance of [Formula: see text]. |
format | Online Article Text |
id | pubmed-7023401 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-70234012020-03-12 Nanotip Contacts for Electric Transport and Field Emission Characterization of Ultrathin MoS(2) Flakes Iemmo, Laura Urban, Francesca Giubileo, Filippo Passacantando, Maurizio Di Bartolomeo, Antonio Nanomaterials (Basel) Article We report a facile approach based on piezoelectric-driven nanotips inside a scanning electron microscope to contact and electrically characterize ultrathin MoS(2) (molybdenum disulfide) flakes on a SiO(2)/Si (silicon dioxide/silicon) substrate. We apply such a method to analyze the electric transport and field emission properties of chemical vapor deposition-synthesized monolayer MoS(2), used as the channel of back-gate field effect transistors. We study the effects of the gate-voltage range and sweeping time on the channel current and on its hysteretic behavior. We observe that the conduction of the MoS(2) channel is affected by trap states. Moreover, we report a gate-controlled field emission current from the edge part of the MoS(2) flake, evidencing a field enhancement factor of approximately [Formula: see text] and a turn-on field of approximately [Formula: see text] at a cathode–anode separation distance of [Formula: see text]. MDPI 2020-01-04 /pmc/articles/PMC7023401/ /pubmed/31947985 http://dx.doi.org/10.3390/nano10010106 Text en © 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Iemmo, Laura Urban, Francesca Giubileo, Filippo Passacantando, Maurizio Di Bartolomeo, Antonio Nanotip Contacts for Electric Transport and Field Emission Characterization of Ultrathin MoS(2) Flakes |
title | Nanotip Contacts for Electric Transport and Field Emission Characterization of Ultrathin MoS(2) Flakes |
title_full | Nanotip Contacts for Electric Transport and Field Emission Characterization of Ultrathin MoS(2) Flakes |
title_fullStr | Nanotip Contacts for Electric Transport and Field Emission Characterization of Ultrathin MoS(2) Flakes |
title_full_unstemmed | Nanotip Contacts for Electric Transport and Field Emission Characterization of Ultrathin MoS(2) Flakes |
title_short | Nanotip Contacts for Electric Transport and Field Emission Characterization of Ultrathin MoS(2) Flakes |
title_sort | nanotip contacts for electric transport and field emission characterization of ultrathin mos(2) flakes |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7023401/ https://www.ncbi.nlm.nih.gov/pubmed/31947985 http://dx.doi.org/10.3390/nano10010106 |
work_keys_str_mv | AT iemmolaura nanotipcontactsforelectrictransportandfieldemissioncharacterizationofultrathinmos2flakes AT urbanfrancesca nanotipcontactsforelectrictransportandfieldemissioncharacterizationofultrathinmos2flakes AT giubileofilippo nanotipcontactsforelectrictransportandfieldemissioncharacterizationofultrathinmos2flakes AT passacantandomaurizio nanotipcontactsforelectrictransportandfieldemissioncharacterizationofultrathinmos2flakes AT dibartolomeoantonio nanotipcontactsforelectrictransportandfieldemissioncharacterizationofultrathinmos2flakes |