Operando Surface Characterization of InP Nanowire p–n Junctions

[Image: see text] We present an in-depth analysis of the surface band alignment and local potential distribution of InP nanowires containing a p–n junction using scanning probe and photoelectron microscopy techniques. The depletion region is localized to a 15 nm thin surface region by scanning tunne...

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Detalles Bibliográficos
Autores principales: McKibbin, Sarah R., Colvin, Jovana, Troian, Andrea, Knutsson, Johan V., Webb, James L., Otnes, Gaute, Dirscherl, Kai, Sezen, Hikmet, Amati, Matteo, Gregoratti, Luca, Borgström, Magnus T., Mikkelsen, Anders, Timm, Rainer
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2019
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7025757/
https://www.ncbi.nlm.nih.gov/pubmed/31891513
http://dx.doi.org/10.1021/acs.nanolett.9b03529

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7025757/
https://www.ncbi.nlm.nih.gov/pubmed/31891513
http://dx.doi.org/10.1021/acs.nanolett.9b03529

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