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Analyses of crystal growth, optical, electrical, thermal and mechanical properties of an excellent detector-grade Cd(0.9)Mn(0.1)Te: V crystal

A high-quality cadmium manganese tellurium (Cd(0.9)Mn(0.1)Te: V or VCMT) crystal was successfully grown via modified Te solution vertical Bridgman method with vanadium doping. The crystal structure and quality were evaluated by powder X-ray diffraction analysis. An infrared transmission spectroscope...

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Detalles Bibliográficos
Autores principales: Luan, Lijun, Gao, Li, Lv, Haohao, Yu, Pengfei, Wang, Tao, He, Yi, Zheng, Dan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7026162/
https://www.ncbi.nlm.nih.gov/pubmed/32066838
http://dx.doi.org/10.1038/s41598-020-59612-0