Restoring drifted electron microscope volumes using synaptic vesicles at sub-pixel accuracy

Imaging ultrastructures in cells using Focused Ion Beam Scanning Electron Microscope (FIB-SEM) yields section-by-section images at nano-resolution. Unfortunately, we observe that FIB-SEM often introduces sub-pixel drifts between sections, in the order of 2.5 nm. The accumulation of these drifts sign...

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Detalles Bibliográficos
Autores principales: Stephensen, Hans Jacob Teglbjærg, Darkner, Sune, Sporring, Jon
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7035423/
https://www.ncbi.nlm.nih.gov/pubmed/32081999
http://dx.doi.org/10.1038/s42003-020-0809-4

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7035423/
https://www.ncbi.nlm.nih.gov/pubmed/32081999
http://dx.doi.org/10.1038/s42003-020-0809-4

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