On the Limits of Scanning Thermal Microscopy of Ultrathin Films

Heat transfer processes in micro- and nanoscale devices have become more and more important during the last decades. Scanning thermal microscopy (SThM) is an atomic force microscopy (AFM) based method for analyzing local thermal conductivities of layers with thicknesses in the range of several nm to...

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Detalles Bibliográficos
Autores principales: Metzke, Christoph, Frammelsberger, Werner, Weber, Jonas, Kühnel, Fabian, Zhu, Kaichen, Lanza, Mario, Benstetter, Günther
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7040652/
https://www.ncbi.nlm.nih.gov/pubmed/31978971
http://dx.doi.org/10.3390/ma13030518

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7040652/
https://www.ncbi.nlm.nih.gov/pubmed/31978971
http://dx.doi.org/10.3390/ma13030518

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