Standard Deviation Quantitative Characterization and Process Optimization of the Pyramidal Texture of Monocrystalline Silicon Cells

To quantitatively characterize the pyramidal texture of monocrystalline silicon cells and to optimize the parameters of the texturing process, the relative standard deviation S(h) was proposed to quantitatively characterize the uniformity of the pyramidal texture. Referring to the definition and cal...

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Detalles Bibliográficos
Autores principales: Fang, Zheng, Xu, Zhilong, Jang, Tao, Zhou, Fei, Huang, Shixiang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7040724/
https://www.ncbi.nlm.nih.gov/pubmed/31991586
http://dx.doi.org/10.3390/ma13030564

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7040724/
https://www.ncbi.nlm.nih.gov/pubmed/31991586
http://dx.doi.org/10.3390/ma13030564

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