Nanoelectromechanical relay without pull-in instability for high-temperature non-volatile memory

Emerging applications such as the Internet-of-Things and more-electric aircraft require electronics with integrated data storage that can operate in extreme temperatures with high energy efficiency. As transistor leakage current increases with temperature, nanoelectromechanical relays have emerged a...

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Detalles Bibliográficos
Autores principales: Rana, Sunil, Mouro, João, Bleiker, Simon J., Reynolds, Jamie D., Chong, Harold M. H., Niklaus, Frank, Pamunuwa, Dinesh
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7055292/
https://www.ncbi.nlm.nih.gov/pubmed/32132542
http://dx.doi.org/10.1038/s41467-020-14872-2

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7055292/
https://www.ncbi.nlm.nih.gov/pubmed/32132542
http://dx.doi.org/10.1038/s41467-020-14872-2

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