Dissection of Superior Alleles for Yield-Related Traits and Their Distribution in Important Cultivars of Wheat by Association Mapping

Uncovering the genetic basis of yield-related traits is important for molecular improvement of wheat cultivars. In this study, a genome-wide association study was conducted using the wheat 55K genotyping assay and a diverse panel of 384 wheat genotypes. The accessions used included 18 founder parent...

Descripción completa

Detalles Bibliográficos
Autores principales: Li, Xiaojun, Xu, Xin, Liu, Weihua, Li, Xiuquan, Yang, Xinming, Ru, Zhengang, Li, Lihui
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Frontiers Media S.A. 2020
Materias:
Plant Science
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7061769/
https://www.ncbi.nlm.nih.gov/pubmed/32194592
http://dx.doi.org/10.3389/fpls.2020.00175

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7061769/
https://www.ncbi.nlm.nih.gov/pubmed/32194592
http://dx.doi.org/10.3389/fpls.2020.00175

Ejemplares similares