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Structural and Electrical Comparison of Si and Zr Doped Hafnium Oxide Thin Films and Integrated FeFETs Utilizing Transmission Kikuchi Diffraction
The microstructure of ferroelectric hafnium oxide plays a vital role for its application, e.g., non-volatile memories. In this study, transmission Kikuchi diffraction and scanning transmission electron microscopy STEM techniques are used to compare the crystallographic phase and orientation of Si an...
Autores principales: | Lederer, Maximilian, Kämpfe, Thomas, Vogel, Norman, Utess, Dirk, Volkmann, Beate, Ali, Tarek, Olivo, Ricardo, Müller, Johannes, Beyer, Sven, Trentzsch, Martin, Seidel, Konrad, Eng, Lukas M. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7075299/ https://www.ncbi.nlm.nih.gov/pubmed/32098415 http://dx.doi.org/10.3390/nano10020384 |
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