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Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis
Atomic force microscopy (AFM) is an important tool for measuring a variety of nanoscale surface properties, such as topography, viscoelasticity, electrical potential and conductivity. Some of these properties are measured using contact methods (static contact or intermittent contact), while others a...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Beilstein-Institut
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7082697/ https://www.ncbi.nlm.nih.gov/pubmed/32215233 http://dx.doi.org/10.3762/bjnano.11.37 |