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Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis

Atomic force microscopy (AFM) is an important tool for measuring a variety of nanoscale surface properties, such as topography, viscoelasticity, electrical potential and conductivity. Some of these properties are measured using contact methods (static contact or intermittent contact), while others a...

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Detalles Bibliográficos
Autores principales:	Uluutku, Berkin, Solares, Santiago D
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Beilstein-Institut 2020
Materias:	Full Research Paper
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7082697/ https://www.ncbi.nlm.nih.gov/pubmed/32215233 http://dx.doi.org/10.3762/bjnano.11.37

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