The Application of Chemical Polishing in TEM Sample Preparation of Zirconium Alloys

Hydride artefacts are commonly induced by the TEM sample preparation process in Zirconium alloys as hydrogen-sensitive metals, including electron polishing and focused ion beam (FIB) technology. In the research, we present the application of chemical polishing with a solution of 10HF:45HNO(3):45H(2)...

Descripción completa

Detalles Bibliográficos
Autores principales: Li, Fusheng, Li, Shilei, Tong, Huan, Xu, Hainan, Wang, Yanli
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7084560/
https://www.ncbi.nlm.nih.gov/pubmed/32106508
http://dx.doi.org/10.3390/ma13051036

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7084560/
https://www.ncbi.nlm.nih.gov/pubmed/32106508
http://dx.doi.org/10.3390/ma13051036

Ejemplares similares