Cargando…
The Application of Chemical Polishing in TEM Sample Preparation of Zirconium Alloys
Hydride artefacts are commonly induced by the TEM sample preparation process in Zirconium alloys as hydrogen-sensitive metals, including electron polishing and focused ion beam (FIB) technology. In the research, we present the application of chemical polishing with a solution of 10HF:45HNO(3):45H(2)...
| Autores principales: | , , , , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2020
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7084560/ https://www.ncbi.nlm.nih.gov/pubmed/32106508 http://dx.doi.org/10.3390/ma13051036 |