A New Fitting Method for Ambipolar Diffusion Length Extraction in Thin Film Structures Using Photoluminescence Measurement with Scanning Excitation

A new simple method is proposed to extract the ambipolar diffusion length for two-dimensional (2D) electronic transport in thin film structures using a scanning photoluminescence microscopy (SPLM) setup. No spatially-resolved photoluminescence detection methods are required. By measuring the excitat...

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Detalles Bibliográficos
Autores principales: Chu, Cheng-Hao, Mao, Ming-Hua, Lin, You-Ru, Lin, Hao-Hsiung
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7090066/
https://www.ncbi.nlm.nih.gov/pubmed/32251350
http://dx.doi.org/10.1038/s41598-020-62093-w

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7090066/
https://www.ncbi.nlm.nih.gov/pubmed/32251350
http://dx.doi.org/10.1038/s41598-020-62093-w

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