High efficiency and stability of ink-jet printed quantum dot light emitting diodes

The low efficiency and fast degradation of devices from ink-jet printing process hinders the application of quantum dot light emitting diodes on next generation displays. Passivating the trap states caused by both anion and cation under-coordinated sites on the quantum dot surface with proper ligand...

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Detalles Bibliográficos
Autores principales: Xiang, Chaoyu, Wu, Longjia, Lu, Zizhe, Li, Menglin, Wen, Yanwei, Yang, Yixing, Liu, Wenyong, Zhang, Ting, Cao, Weiran, Tsang, Sai-Wing, Shan, Bin, Yan, Xiaolin, Qian, Lei
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7118149/
https://www.ncbi.nlm.nih.gov/pubmed/32242016
http://dx.doi.org/10.1038/s41467-020-15481-9

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7118149/
https://www.ncbi.nlm.nih.gov/pubmed/32242016
http://dx.doi.org/10.1038/s41467-020-15481-9

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