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Application of machine learning techniques to electron microscopic/spectroscopic image data analysis
The combination of scanning transmission electron microscopy (STEM) with analytical instruments has become one of the most indispensable analytical tools in materials science. A set of microscopic image/spectral intensities collected from many sampling points in a region of interest, in which multip...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Oxford University Press
2019
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7141894/ https://www.ncbi.nlm.nih.gov/pubmed/31682260 http://dx.doi.org/10.1093/jmicro/dfz036 |