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Advances in High-Resolution Radiation Detection Using 4H-SiC Epitaxial Layer Devices

Advances towards achieving the goal of miniature 4H-SiC based radiation detectors for harsh environment application have been studied extensively and reviewed in this article. The miniaturized devices were developed at the University of South Carolina (UofSC) on 8 × 8 mm 4H-SiC epitaxial layer wafer...

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Detalles Bibliográficos
Autores principales: Mandal, Krishna C., Kleppinger, Joshua W., Chaudhuri, Sandeep K.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7142523/
https://www.ncbi.nlm.nih.gov/pubmed/32121162
http://dx.doi.org/10.3390/mi11030254