In-Line Holography in Transmission Electron Microscopy for the Atomic Resolution Imaging of Single Particle of Radiation-Sensitive Matter

In this paper, for the first time it is shown how in-line holography in Transmission Electron Microscopy (TEM) enables the study of radiation-sensitive nanoparticles of organic and inorganic materials providing high-contrast holograms of single nanoparticles, while illuminating specimens with a dens...

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Detalles Bibliográficos
Autor principal: Carlino, Elvio
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7142924/
https://www.ncbi.nlm.nih.gov/pubmed/32245011
http://dx.doi.org/10.3390/ma13061413

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7142924/
https://www.ncbi.nlm.nih.gov/pubmed/32245011
http://dx.doi.org/10.3390/ma13061413

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