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Applying Fast Scanning Method Coupled with Digital Image Processing Technology as Standard Acquisition Mode for Scanning Electron Microscopy

This study proposes an efficient and fast method of scanning (e.g., television (TV) scan) coupled with digital image processing technology to replace the conventional slow-scan mode as a standard model of acquisition for general-purpose scanning electron microscopy (SEM). SEM images obtained using t...

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Detalles Bibliográficos
Autores principales: Oho, Eisaku, Suzuki, Kazuhiko, Yamazaki, Sadao
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7150696/
https://www.ncbi.nlm.nih.gov/pubmed/32292536
http://dx.doi.org/10.1155/2020/4979431