Localized Strain Measurement in Molecular Beam Epitaxially Grown Chalcogenide Thin Films by Micro-Raman Spectroscopy

[Image: see text] We developed an experimental metrology for measuring local strain in molecular beam epitaxially (MBE) grown crystalline chalcogenide thin films through micro-Raman spectroscopy. For In(2)Se(3) and Bi(2)Se(3) on c-plane sapphire substrates, the transverse-optical vibrational mode (A...

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Detalles Bibliográficos
Autores principales: Li, Qiu, Wang, Yong, Li, Tiantian, Li, Wei, Wang, Feifan, Janotti, Anderson, Law, Stephanie, Gu, Tingyi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2020
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7161023/
https://www.ncbi.nlm.nih.gov/pubmed/32309718
http://dx.doi.org/10.1021/acsomega.0c00224

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7161023/
https://www.ncbi.nlm.nih.gov/pubmed/32309718
http://dx.doi.org/10.1021/acsomega.0c00224

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