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Localized Strain Measurement in Molecular Beam Epitaxially Grown Chalcogenide Thin Films by Micro-Raman Spectroscopy
[Image: see text] We developed an experimental metrology for measuring local strain in molecular beam epitaxially (MBE) grown crystalline chalcogenide thin films through micro-Raman spectroscopy. For In(2)Se(3) and Bi(2)Se(3) on c-plane sapphire substrates, the transverse-optical vibrational mode (A...
Autores principales: | Li, Qiu, Wang, Yong, Li, Tiantian, Li, Wei, Wang, Feifan, Janotti, Anderson, Law, Stephanie, Gu, Tingyi |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
American Chemical Society
2020
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7161023/ https://www.ncbi.nlm.nih.gov/pubmed/32309718 http://dx.doi.org/10.1021/acsomega.0c00224 |
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