Concepts for structured illumination microscopy with extended axial resolution through mirrored illumination

Wide-field fluorescence microscopy, while much faster than confocal microscopy, suffers from a lack of optical sectioning and poor axial resolution. 3D structured illumination microscopy (SIM) has been demonstrated to provide optical sectioning and to double the resolution limit both laterally and a...

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Detalles Bibliográficos
Autores principales: Manton, James D., Ströhl, Florian, Fiolka, Reto, Kaminski, Clemens F., Rees, Eric J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Optical Society of America 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7173891/
https://www.ncbi.nlm.nih.gov/pubmed/32341869
http://dx.doi.org/10.1364/BOE.382398

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7173891/
https://www.ncbi.nlm.nih.gov/pubmed/32341869
http://dx.doi.org/10.1364/BOE.382398

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