An Effective Simulation Analysis of Transient Electromagnetic Multiple Faults

Embedded encryption devices and smart sensors are vulnerable to physical attacks. Due to the continuous shrinking of chip size, laser injection, particle radiation and electromagnetic transient injection are possible methods that introduce transient multiple faults. In the fault analysis stage, the...

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Detalles Bibliográficos
Autores principales: Dong, Liang, Zhang, Hongxin, Sun, Shaofei, Zhu, Lei, Cui, Xiaotong, Ghosh, Bablu K.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7181125/
https://www.ncbi.nlm.nih.gov/pubmed/32244774
http://dx.doi.org/10.3390/s20071976

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7181125/
https://www.ncbi.nlm.nih.gov/pubmed/32244774
http://dx.doi.org/10.3390/s20071976

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