Cargando…
Optical Thickness Monitoring as a Strategic Element for the Development of SPR Sensing Applications
The importance of the monitoring of thickness and rate deposition is indispensable for the fabrication of thin film sensors, such as SPR sensors. The sensitivity of SPR responses varies with the thickness of the film, as well as the linear range. Thus, in the present work, we presented an experiment...
| Autores principales: | , , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2020
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7181204/ https://www.ncbi.nlm.nih.gov/pubmed/32218108 http://dx.doi.org/10.3390/s20071807 |