Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach

In this work, a high-resolution atomic force acoustic microscopy imaging technique is developed in order to obtain the local indentation modulus at the nanoscale level. The technique uses a model that gives a qualitative relationship between a set of contact resonance frequencies and the indentation...

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Detalles Bibliográficos
Autores principales: Cruz Valeriano, Edgar, Gervacio Arciniega, José Juan, Enriquez Flores, Christian Iván, Meraz Dávila, Susana, Moreno Palmerin, Joel, Hernández Landaverde, Martín Adelaido, Chipatecua Godoy, Yuri Lizbeth, Gutiérrez Peralta, Aime Margarita, Ramírez Bon, Rafael, Yañez Limón, José Martín
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2020
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7214876/
https://www.ncbi.nlm.nih.gov/pubmed/32461872
http://dx.doi.org/10.3762/bjnano.11.58

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7214876/
https://www.ncbi.nlm.nih.gov/pubmed/32461872
http://dx.doi.org/10.3762/bjnano.11.58

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