An efficient method for indexing grazing-incidence X-ray diffraction data of epitaxially grown thin films

Crystal structure identification of thin organic films entails a number of technical and methodological challenges. In particular, if molecular crystals are epitaxially grown on single-crystalline substrates a complex scenario of multiple preferred orientations of the adsorbate, several symmetry-rel...

Descripción completa

Detalles Bibliográficos
Autores principales: Simbrunner, Josef, Schrode, Benedikt, Domke, Jari, Fritz, Torsten, Salzmann, Ingo, Resel, Roland
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2020
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7233012/
https://www.ncbi.nlm.nih.gov/pubmed/32356785
http://dx.doi.org/10.1107/S2053273320001266

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7233012/
https://www.ncbi.nlm.nih.gov/pubmed/32356785
http://dx.doi.org/10.1107/S2053273320001266

Ejemplares similares