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An efficient method for indexing grazing-incidence X-ray diffraction data of epitaxially grown thin films
Crystal structure identification of thin organic films entails a number of technical and methodological challenges. In particular, if molecular crystals are epitaxially grown on single-crystalline substrates a complex scenario of multiple preferred orientations of the adsorbate, several symmetry-rel...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7233012/ https://www.ncbi.nlm.nih.gov/pubmed/32356785 http://dx.doi.org/10.1107/S2053273320001266 |