Atomic-Resolution EDX, HAADF, and EELS Study of GaAs(1-x)Bi(x) Alloys

The distribution of alloyed atoms in semiconductors often deviates from a random distribution which can have significant effects on the properties of the materials. In this study, scanning transmission electron microscopy techniques are employed to analyze the distribution of Bi in several distinctl...

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Detalles Bibliográficos
Autores principales: Paulauskas, Tadas, Pačebutas, Vaidas, Butkutė, Renata, Čechavičius, Bronislovas, Naujokaitis, Arnas, Kamarauskas, Mindaugas, Skapas, Martynas, Devenson, Jan, Čaplovičová, Mária, Vretenár, Viliam, Li, Xiaoyan, Kociak, Mathieu, Krotkus, Arūnas
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer US 2020
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7248167/
https://www.ncbi.nlm.nih.gov/pubmed/32451638
http://dx.doi.org/10.1186/s11671-020-03349-2

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7248167/
https://www.ncbi.nlm.nih.gov/pubmed/32451638
http://dx.doi.org/10.1186/s11671-020-03349-2

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