X-ray nano-tomography of complete scales from the ultra-white beetles Lepidiota stigma and Cyphochilus

High resolution X-ray nano-tomography experiments are often limited to a few tens of micrometer size volumes due to detector size. It is possible, through the use of multiple overlapping tomography scans, to produce a large area scan which can encompass a sample in its entirety. Mounting and positio...

Descripción completa

Detalles Bibliográficos
Autores principales: Burg, Stephanie L., Washington, Adam L., Villanova, Julie, Dennison, Andrew J. C., McLoughlin, Daragh, Mykhaylyk, Oleksandr O., Vukusic, Pete, Furnass, Will, Jones, Richard A. L., Parnell, Andrew J., Fairclough, J. Patrick A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Data Descriptor
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7260169/
https://www.ncbi.nlm.nih.gov/pubmed/32472045
http://dx.doi.org/10.1038/s41597-020-0502-y

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7260169/
https://www.ncbi.nlm.nih.gov/pubmed/32472045
http://dx.doi.org/10.1038/s41597-020-0502-y

Ejemplares similares