Comparison of the Enamel Surface Roughness from Different Polishing Methods: Scanning Electron Microscopy and Atomic Force Microscopy Investigation

Objective  This study aimed to compare the enamel surface roughness created by four polishing methods after debonding, by using scanning electron microscopy (SEM) and atomic force microscopy (AFM). Materials and Methods  Four experimental polishing groups (Sof-Lex disc, SD; sandblaster, SB; tungsten...

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Detalles Bibliográficos
Autores principales: Sugsompian, Kiatanan, Tansalarak, Ratchawan, Piyapattamin, Thosapol
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Thieme Medical and Scientific Publishers Private Ltd. 2020
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7274833/
https://www.ncbi.nlm.nih.gov/pubmed/32392603
http://dx.doi.org/10.1055/s-0040-1709945

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7274833/
https://www.ncbi.nlm.nih.gov/pubmed/32392603
http://dx.doi.org/10.1055/s-0040-1709945

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