Cargando…
Thickness measurement of transparent liquid films with Paraxial Self-Reference Interferometry
In this paper, we introduce a non-invasive optical method, named Paraxial Self-Reference Interferometry (PSRI) for thickness measurement of liquid films. The method can be used for thin or thick layers (from μm to mm) of solids or liquids, with a high precision. The method is first applied to solid...
| Autores principales: | , , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2020
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7280532/ https://www.ncbi.nlm.nih.gov/pubmed/32513992 http://dx.doi.org/10.1038/s41598-020-65799-z |