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Accounting for variability in ion current recordings using a mathematical model of artefacts in voltage-clamp experiments

Mathematical models of ion channels, which constitute indispensable components of action potential models, are commonly constructed by fitting to whole-cell patch-clamp data. In a previous study, we fitted cell-specific models to hERG1a (Kv11.1) recordings simultaneously measured using an automated...

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Autores principales: Lei, Chon Lok, Clerx, Michael, Whittaker, Dominic G., Gavaghan, David J., de Boer, Teun P., Mirams, Gary R.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: The Royal Society Publishing 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7287334/
https://www.ncbi.nlm.nih.gov/pubmed/32448060
http://dx.doi.org/10.1098/rsta.2019.0348
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author Lei, Chon Lok
Clerx, Michael
Whittaker, Dominic G.
Gavaghan, David J.
de Boer, Teun P.
Mirams, Gary R.
author_facet Lei, Chon Lok
Clerx, Michael
Whittaker, Dominic G.
Gavaghan, David J.
de Boer, Teun P.
Mirams, Gary R.
author_sort Lei, Chon Lok
collection PubMed
description Mathematical models of ion channels, which constitute indispensable components of action potential models, are commonly constructed by fitting to whole-cell patch-clamp data. In a previous study, we fitted cell-specific models to hERG1a (Kv11.1) recordings simultaneously measured using an automated high-throughput system, and studied cell-cell variability by inspecting the resulting model parameters. However, the origin of the observed variability was not identified. Here, we study the source of variability by constructing a model that describes not just ion current dynamics, but the entire voltage-clamp experiment. The experimental artefact components of the model include: series resistance, membrane and pipette capacitance, voltage offsets, imperfect compensations made by the amplifier for these phenomena, and leak current. In this model, variability in the observations can be explained by either cell properties, measurement artefacts, or both. Remarkably, by assuming that variability arises exclusively from measurement artefacts, it is possible to explain a larger amount of the observed variability than when assuming cell-specific ion current kinetics. This assumption also leads to a smaller number of model parameters. This result suggests that most of the observed variability in patch-clamp data measured under the same conditions is caused by experimental artefacts, and hence can be compensated for in post-processing by using our model for the patch-clamp experiment. This study has implications for the question of the extent to which cell-cell variability in ion channel kinetics exists, and opens up routes for better correction of artefacts in patch-clamp data. This article is part of the theme issue ‘Uncertainty quantification in cardiac and cardiovascular modelling and simulation’.
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spelling pubmed-72873342020-06-12 Accounting for variability in ion current recordings using a mathematical model of artefacts in voltage-clamp experiments Lei, Chon Lok Clerx, Michael Whittaker, Dominic G. Gavaghan, David J. de Boer, Teun P. Mirams, Gary R. Philos Trans A Math Phys Eng Sci Articles Mathematical models of ion channels, which constitute indispensable components of action potential models, are commonly constructed by fitting to whole-cell patch-clamp data. In a previous study, we fitted cell-specific models to hERG1a (Kv11.1) recordings simultaneously measured using an automated high-throughput system, and studied cell-cell variability by inspecting the resulting model parameters. However, the origin of the observed variability was not identified. Here, we study the source of variability by constructing a model that describes not just ion current dynamics, but the entire voltage-clamp experiment. The experimental artefact components of the model include: series resistance, membrane and pipette capacitance, voltage offsets, imperfect compensations made by the amplifier for these phenomena, and leak current. In this model, variability in the observations can be explained by either cell properties, measurement artefacts, or both. Remarkably, by assuming that variability arises exclusively from measurement artefacts, it is possible to explain a larger amount of the observed variability than when assuming cell-specific ion current kinetics. This assumption also leads to a smaller number of model parameters. This result suggests that most of the observed variability in patch-clamp data measured under the same conditions is caused by experimental artefacts, and hence can be compensated for in post-processing by using our model for the patch-clamp experiment. This study has implications for the question of the extent to which cell-cell variability in ion channel kinetics exists, and opens up routes for better correction of artefacts in patch-clamp data. This article is part of the theme issue ‘Uncertainty quantification in cardiac and cardiovascular modelling and simulation’. The Royal Society Publishing 2020-06-12 2020-05-25 /pmc/articles/PMC7287334/ /pubmed/32448060 http://dx.doi.org/10.1098/rsta.2019.0348 Text en © 2020 The Authors. http://creativecommons.org/licenses/by/4.0/ http://creativecommons.org/licenses/by/4.0/http://creativecommons.org/licenses/by/4.0/Published by the Royal Society under the terms of the Creative Commons Attribution License http://creativecommons.org/licenses/by/4.0/, which permits unrestricted use, provided the original author and source are credited.
spellingShingle Articles
Lei, Chon Lok
Clerx, Michael
Whittaker, Dominic G.
Gavaghan, David J.
de Boer, Teun P.
Mirams, Gary R.
Accounting for variability in ion current recordings using a mathematical model of artefacts in voltage-clamp experiments
title Accounting for variability in ion current recordings using a mathematical model of artefacts in voltage-clamp experiments
title_full Accounting for variability in ion current recordings using a mathematical model of artefacts in voltage-clamp experiments
title_fullStr Accounting for variability in ion current recordings using a mathematical model of artefacts in voltage-clamp experiments
title_full_unstemmed Accounting for variability in ion current recordings using a mathematical model of artefacts in voltage-clamp experiments
title_short Accounting for variability in ion current recordings using a mathematical model of artefacts in voltage-clamp experiments
title_sort accounting for variability in ion current recordings using a mathematical model of artefacts in voltage-clamp experiments
topic Articles
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7287334/
https://www.ncbi.nlm.nih.gov/pubmed/32448060
http://dx.doi.org/10.1098/rsta.2019.0348
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