X-ray diffraction using focused-ion-beam-prepared single crystals

High-quality single-crystal X-ray diffraction measurements are a prerequisite for obtaining precise and reliable structure data and electron densities. The single crystal should therefore fulfill several conditions, of which a regular defined shape is of particularly high importance for compounds co...

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Detalles Bibliográficos
Autores principales: Weigel, Tina, Funke, Claudia, Zschornak, Matthias, Behm, Thomas, Stöcker, Hartmut, Leisegang, Tilmann, Meyer, Dirk C.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2020
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7312134/
https://www.ncbi.nlm.nih.gov/pubmed/32684876
http://dx.doi.org/10.1107/S1600576720003143

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7312134/
https://www.ncbi.nlm.nih.gov/pubmed/32684876
http://dx.doi.org/10.1107/S1600576720003143

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