Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization

Atomic force microscopy-infrared (AFM-IR) spectroscopic imaging offers non-perturbative, molecular contrast for nanoscale characterization. The need to mitigate measurement artifacts and enhance sensitivity, however, requires narrowly-defined and strict sample preparation protocols. This limits reli...

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Detalles Bibliográficos
Autores principales: Kenkel, Seth, Mittal, Shachi, Bhargava, Rohit
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7320136/
https://www.ncbi.nlm.nih.gov/pubmed/32591515
http://dx.doi.org/10.1038/s41467-020-17043-5

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7320136/
https://www.ncbi.nlm.nih.gov/pubmed/32591515
http://dx.doi.org/10.1038/s41467-020-17043-5

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