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Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization
Atomic force microscopy-infrared (AFM-IR) spectroscopic imaging offers non-perturbative, molecular contrast for nanoscale characterization. The need to mitigate measurement artifacts and enhance sensitivity, however, requires narrowly-defined and strict sample preparation protocols. This limits reli...
Autores principales: | Kenkel, Seth, Mittal, Shachi, Bhargava, Rohit |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7320136/ https://www.ncbi.nlm.nih.gov/pubmed/32591515 http://dx.doi.org/10.1038/s41467-020-17043-5 |
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