Genome-wide mapping and allelic fingerprinting provide insights into the genetics of resistance to wheat stripe rust in India, Kenya and Mexico

Stripe or yellow rust (YR) caused by Puccinia striiformis Westend. f. sp. tritici Erikss. is a persistent biotic-stress threatening global wheat production. To broaden our understanding of the shared genetic basis of YR resistance across multi-site and multi-year evaluations, we performed a large ge...

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Detalles Bibliográficos
Autores principales: Juliana, Philomin, Singh, Ravi Prakash, Huerta-Espino, Julio, Bhavani, Sridhar, Randhawa, Mandeep S., Kumar, Uttam, Joshi, Arun Kumar, Bhati, Pradeep Kumar, Mir, Hector Eduardo Villasenor, Mishra, Chandra Nath, Singh, Gyanendra Pratap
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7331708/
https://www.ncbi.nlm.nih.gov/pubmed/32616836
http://dx.doi.org/10.1038/s41598-020-67874-x

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7331708/
https://www.ncbi.nlm.nih.gov/pubmed/32616836
http://dx.doi.org/10.1038/s41598-020-67874-x

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