Sub-2 Angstrom resolution structure determination using single-particle cryo-EM at 200 keV

Although the advent of direct electron detectors (DEDs) and software developments have enabled the routine use of single-particle cryogenic electron microscopy (cryo-EM) for structure determination of well-behaved specimens to high-resolution, there nonetheless remains a discrepancy between the reso...

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Detalles Bibliográficos
Autores principales: Wu, Mengyu, Lander, Gabriel C., Herzik, Mark A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7337053/
https://www.ncbi.nlm.nih.gov/pubmed/32647824
http://dx.doi.org/10.1016/j.yjsbx.2020.100020

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7337053/
https://www.ncbi.nlm.nih.gov/pubmed/32647824
http://dx.doi.org/10.1016/j.yjsbx.2020.100020

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