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Sub-2 Angstrom resolution structure determination using single-particle cryo-EM at 200 keV
Although the advent of direct electron detectors (DEDs) and software developments have enabled the routine use of single-particle cryogenic electron microscopy (cryo-EM) for structure determination of well-behaved specimens to high-resolution, there nonetheless remains a discrepancy between the reso...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Elsevier
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7337053/ https://www.ncbi.nlm.nih.gov/pubmed/32647824 http://dx.doi.org/10.1016/j.yjsbx.2020.100020 |