Refined Calibration Model for Improving the Orientation Precision of Electron Backscatter Diffraction Maps

For the precise determination of orientations in polycrystalline materials, electron backscatter diffraction (EBSD) requires a consistent calibration of the diffraction geometry in the scanning electron microscope (SEM). In the present paper, the variation of the projection center for the Kikuchi di...

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Detalles Bibliográficos
Autores principales: Winkelmann, Aimo, Nolze, Gert, Cios, Grzegorz, Tokarski, Tomasz, Bała, Piotr
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7344741/
https://www.ncbi.nlm.nih.gov/pubmed/32585868
http://dx.doi.org/10.3390/ma13122816

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7344741/
https://www.ncbi.nlm.nih.gov/pubmed/32585868
http://dx.doi.org/10.3390/ma13122816

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