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Refined Calibration Model for Improving the Orientation Precision of Electron Backscatter Diffraction Maps
For the precise determination of orientations in polycrystalline materials, electron backscatter diffraction (EBSD) requires a consistent calibration of the diffraction geometry in the scanning electron microscope (SEM). In the present paper, the variation of the projection center for the Kikuchi di...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7344741/ https://www.ncbi.nlm.nih.gov/pubmed/32585868 http://dx.doi.org/10.3390/ma13122816 |