Defect Classification Using Postpeak Value for Pulsed Eddy-Current Technique

In this paper, a feature termed as the postpeak value is proposed for the pulsed eddy current technique (PECT). Moreover, a method using the postpeak value is proposed to classify surface and reverse defects. A PECT system is built for verification purposes. Experiment results prove that the postpea...

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Detalles Bibliográficos
Autores principales: Ge, Jiuhao, Yang, Chenkai, Wang, Ping, Shi, Yongsheng
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Letter
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7349699/
https://www.ncbi.nlm.nih.gov/pubmed/32560050
http://dx.doi.org/10.3390/s20123390

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7349699/
https://www.ncbi.nlm.nih.gov/pubmed/32560050
http://dx.doi.org/10.3390/s20123390

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